Abstract
With the modern trend in chip functionalities and chip size, considerable advancement
has been made in EDA (Electronic Design Automation). EDA algorithms have become
irreplaceable in the semiconductor industry. We use adjoint sensitivity analysis and transient
simulations to render runtimes affordable and responses accurate.
This dissertation presents various advantages of adjoint sensitivity analysis to improve
the design cycle, provide better testing, and make more efficient the diagnosis of analog
circuits. Our motivation for all our applications has been to greatly reduce the computational
resources required while still providing the required result for design diagnosis and test.
Degree Date
Fall 2023
Document Type
Dissertation
Degree Name
Ph.D.
Department
Computer Science and Engineering
Advisor
Dr. Jennifer Dworak
Second Advisor
Dr. Ron Rohrer
Third Advisor
Dr. Gary Evans
Fourth Advisor
Dr. Theodore Manikas
Fifth Advisor
Dr. Timothy Rost
Sixth Advisor
Dr. Prasanna Rangarajan
Subject Area
Computer Engineering
Number of Pages
105
Format
Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial 4.0 License
Recommended Citation
Shah, Nisharg, "Computationally Efficient Design, Diagnosis, And Test Of Analog Integrated Circuit Analysis" (2023). Computer Science and Engineering Theses and Dissertations. 30.
https://scholar.smu.edu/engineering_compsci_etds/30
