Abstract
Consumer electronics changed the semiconductor industry by developing many new challenges for consumer products. One of the main challenges in the consumer product is that it propelled the volume of production to massive production, e.g. hundreds of millions of cell phones are produced yearly. Combined with the overproduction of consumer products, price pressure is another challenge for consumer products. Many of the new techniques used in the design and fabrication enabled the integration of more devices in the same chips. This reduced the cost of the chips, lowered the power consumption, increased the circuit operation speed, enabled more reliable implementation, and reduced physical size. Complications in the testing phase increased and the stress of the cost required new techniques in testing. Now, testing is the bottleneck in high volume production, and it counts for a notable share of the chip cost.
This dissertation seeks to address the test cost challenges across two distinct works: 1- Combining the Parallel test technique with the Concurrent test on mixed-signal chips to have the PaRent testing. The PaRent testing will amplify the savings in test time and the throughput in production. 2- Real-time monitoring of manufacturing yield to be used in the production to reduce any wasted material and time due to issues not related to the chip itself.
Degree Date
Winter 12-21-2019
Document Type
Dissertation
Degree Name
Ph.D.
Department
Electrical and Computer Engineering
Advisor
Ping Gui
Second Advisor
Jennifer Dworak
Third Advisor
Mitch Thornton
Fourth Advisor
Mohammad Khodayar
Fifth Advisor
Monnie McGee
Sixth Advisor
Qing Zhao
Seventh Advisor
Theodore Manikas
Number of Pages
132
Format
Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial 4.0 License
Recommended Citation
Khasawneh, Qutaiba, "Reducing the Production Cost of Semiconductor Chips Using (Parallel and Concurrent) Testing and Real-Time Monitoring" (2019). Electrical Engineering Theses and Dissertations. 32.
https://scholar.smu.edu/engineering_electrical_etds/32
Included in
Electrical and Electronics Commons, Electronic Devices and Semiconductor Manufacturing Commons